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Galaxy Test 2010.03  

Synopsys Galaxy Test , consisting of DFTMAX™ compression and TetraMAX® ATPG, is widely deployed across all semiconductor industries. The latest release of DFTMAX™ compression and TetraMAX ® ATPG includes new capabilities to reduce test costs, increase high test quality, and improve your ability to debug test issues.


Galaxy Test 2010.03 Introduction
Amy Mitby introduces the latest release and highlights four new powerful features.

Amy Mitby, Sr. Test Applications Consultant

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